, Advanced Numerical Research & Analysis Group, Hyderabad, India

• Defence Science Journal Vol. 56 No. 1: Quality and Reliability in Aerospace Systems - Special Issue Papers
  3-D MCM Technology for Miniaturisation of an Electronic System
  Abstract  PDF
• Defence Science Journal Vol. 45 No. 3: Antitank Guided Missiles - Computers & Systems Studies
  New Metric Based Algorithm for Test Vector Generation in VLSI Testing
  Abstract  PDF
• Defence Science Journal Vol. 45 No. 4: Imaging - Electronics & Communication Systems
  Fuzzy Logic and VLSI Testing
  Abstract  PDF