Atre, M. V., Advanced Numerical Research & Analysis Group, Hyderabad, India

• Defence Science Journal Vol 45 No 3: Antitank Guided Missiles - Computers & Systems Studies
  New Metric Based Algorithm for Test Vector Generation in VLSI Testing
  Abstract  PDF
• Defence Science Journal Vol 45 No 4: Imaging - Electronics & Communication Systems
  Fuzzy Logic and VLSI Testing
  Abstract  PDF