Automatic Dispersion Measurements of Helical Slow- Wave Structure

  • S. J. Rao Massachusetts Institute of Technology, USA
  • S. Subramanian Microwave Tube Research & Development Centre, Bangalore
  • S. K. Datta Microwave Tube Research & Development Centre, Bangalore
  • R. Seshadri Microwave Tube Research & Development Centre, Bangalore
Keywords: Dispersion characteristics, Slow wave structures, Perturbation techniques

Abstract

An experimental setup for computer-controlled automatic measurement of dispersion characteristi of helical slow-wave structures (SWSs) has been described. A non-resonant perturbation technique was employed for this purpose. The dispersion characteristics of a practical X-Ku band helical SWS
were studied using this experimental setup. The experimental results have shown good agreement with analytical results obtained using an equivalent circuit approach for an X-Ku band helix SWS.

References

Steele, C. W. A non-resonant perturbation theory. IEEE Trans. Microw. Theory Tech., 1966, MTT-14, 70- 74.

Leggara, J .R. Measurement of microwave characteristics of helix travelit:1g wave circuits. IEEE International Electron Devices Meeting. Technical Digest, 1979: pp. 408-11.

Basu, BoN 0 Equivalent circuit analysis of a dielectric-supported helix in a metal shell. Int. .J Electron. 1979, 47, 3 -14

Jain, P.K. & Basu, B.N. The inhomogeneous dielectric loading effects of a practical helix supports on the interaction impedance of the slow-wave structure. IEEE Trans. Electron

Devices, 1992, ED-39, 727-33.

Published
2013-01-01
How to Cite
Rao, S., Subramanian, S., Datta, S., & Seshadri, R. (2013). Automatic Dispersion Measurements of Helical Slow- Wave Structure. Defence Science Journal, 50(1), 83-86. https://doi.org/10.14429/dsj.50.3353
Section
Electronics & Communication Systems