Agrawal, R.K., Jawaharlal Nehru University, New Delhi, India
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Defence Science Journal Vol 60 No 4: Machine Learning and Pattern Recognition - Research Papers
Statistical Measures to Determine Optimal Structure of Decision Tree: One versus One Support Vector Machine
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Defence Science Journal Vol 62 No 1: Cryptology and Communication Security - Special Issue Papers
Performance Evaluation of Exponential Discriminant Analysis with Feature Selection for Steganalysis
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