Surface Passivation of Mercury-Cadmium-Telluride Infrared Detectors

Authors

  • R. Singh Solid State Physics Laboratory, Delhi
  • A. K. Gupta Solid State Physics Laboratory, Delhi
  • K. C. Chhabra Solid State Physics Laboratory, Delhi

DOI:

https://doi.org/10.14429/dsj.41.4426

Keywords:

Mercury cadmium telluride, Photochemical, Infrared detectors

Abstract

The theoretical considerations and practical aspects of passivating insulator films, in the context of their use on high-performance mercury cadmium telluride (MCT) infrared detectors are reviewed. The methods of growth, the interface properties and the applications of both native and deposited passivant films have been discussed. Native films include anodic, chemical, photochemical, and plasma oxides as well as anodic sulphides and fluoro-oxides. Deposited films include ZnS, photo-CVD-grown SiO2, CDTe, and SiN/sub x/. The properties of all these passivant films on MCT have been summarized.

Author Biographies

R. Singh, Solid State Physics Laboratory, Delhi

Solidstate Physics Laboratory, Lucknow Road, Delhi

A. K. Gupta, Solid State Physics Laboratory, Delhi

Solidstate Physics Laboratory, Lucknow Road, Delhi

K. C. Chhabra, Solid State Physics Laboratory, Delhi

Solidstate Physics Laboratory, Lucknow Road, Delhi

Downloads

Published

2013-01-01

How to Cite

Singh, R., Gupta, A. K., & Chhabra, K. C. (2013). Surface Passivation of Mercury-Cadmium-Telluride Infrared Detectors. Defence Science Journal, 41(3), 205–239. https://doi.org/10.14429/dsj.41.4426

Issue

Vol. 41 No. 3

Section

Electronics & Communication Systems

License

 Where otherwise noted, the Articles on this site are licensed under Creative Commons License: CC Attribution-Noncommercial-No Derivative Works 2.5 India