Surface Passivation of Mercury-Cadmium-Telluride Infrared Detectors

  • R. Singh Solid State Physics Laboratory, Delhi
  • A. K. Gupta Solid State Physics Laboratory, Delhi
  • K. C. Chhabra Solid State Physics Laboratory, Delhi
Keywords: Mercury cadmium telluride, Photochemical, Infrared detectors

Abstract

The theoretical considerations and practical aspects of passivating insulator films, in the context of their use on high-performance mercury cadmium telluride (MCT) infrared detectors are reviewed. The methods of growth, the interface properties and the applications of both native and deposited passivant films have been discussed. Native films include anodic, chemical, photochemical, and plasma oxides as well as anodic sulphides and fluoro-oxides. Deposited films include ZnS, photo-CVD-grown SiO2, CDTe, and SiN/sub x/. The properties of all these passivant films on MCT have been summarized.

Author Biographies

R. Singh, Solid State Physics Laboratory, Delhi
Solidstate Physics Laboratory, Lucknow Road, Delhi
A. K. Gupta, Solid State Physics Laboratory, Delhi
Solidstate Physics Laboratory, Lucknow Road, Delhi
K. C. Chhabra, Solid State Physics Laboratory, Delhi
Solidstate Physics Laboratory, Lucknow Road, Delhi
Published
2013-01-01
How to Cite
Singh, R., Gupta, A., & Chhabra, K. (2013). Surface Passivation of Mercury-Cadmium-Telluride Infrared Detectors. Defence Science Journal, 41(3), 205-239. https://doi.org/10.14429/dsj.41.4426
Section
Electronics & Communication Systems