Measurement of Out-of-plane Dynamic Deformations by Digital Speckle Pattern Interferometry

  • Rajesh Kurnar Indian Institute of Technology Delhi, New Delhi
  • Chandra Shakher Indian Institute of Technology Delhi, New Delhi
Keywords: Digital speckle pattem interferometry, dynamic deformations, large deformations, signalto- noise ratio, histogram equalisation, Symlet wavelet, Daubechies wavelet, phase filter, wavelet filter, minimum-phase filter

Abstract

In this paper, measurement of dynamic deformations in a rectangular plate fixed at one end, using digital speckle pattem interferometry (DSPI), has been prese,nted. To improve the measurement accuracy,
a new filtering scheme has been developed. This scheme is based on the combination of average/ median filtering and Symlet wavelet filtering which enhances the signal-to-noise ratio in the speckle
interferogram obtained from the DSPI. Experimental results show that this filtering scheme is quite effective in improving signal-to-noise ratio of the speckle .interferogram. The measurements by DSPI
and accelerometer are in good agreement. The DSPI technique can be implemented for measuring the large deformations as well.
Published
2003-01-02
How to Cite
Kurnar, R., & Shakher, C. (2003). Measurement of Out-of-plane Dynamic Deformations by Digital Speckle Pattern Interferometry. Defence Science Journal, 53(1), 115-121. https://doi.org/10.14429/dsj.53.2136
Section
Special Issue Papers