Numerical Analysis and Measurement of Electric field Strength inside GTEM Cell at GSM Frequencies

Naina Narang; Satya K. Dubey; V.N. Ojha

doi:10.14429/dsj.69.14944

Naina Narang Computer and Communication Engineering, Manipal University Jaipur, Jaipur
Satya K. Dubey Microwave Standards, CSIR National Physical Laboratory, New Delhi
V.N. Ojha Microwave Standards, CSIR National Physical Laboratory, New Delhi

DOI: https://doi.org/10.14429/dsj.69.14944

Keywords: E-field probe, GTEM cell, Microstrip, RF exposure, Uncertainty

Abstract

A miniaturised gigahertz transverse electromagnetic (GTEM) cell is designed and fabricated to generate uniform electric (E-) field, essential for studying the radio frequency exposure effect on tissue equivalent liquids at global system for mobile (GSM) communication frequencies (914 MHz and 2.10 GHz). The simulation procedure is discussed and its results are compared with measurement data. The E-field strength inside the GTEM cell is scanned using a microstrip based E-field probe and complete uncertainty evaluation procedure is discussed. Theoretically, simulated and measured E-field strength is reported with expanded uncertainty.

Author Biographies

Naina Narang, Computer and Communication Engineering, Manipal University Jaipur, Jaipur

Dr Naina Narang did her PhD from CSIR National Physical Laboratory, New Delhi and is presently working as Assistant Professor at Department of Computer and Communication Engineering, Manipal University, Jaipur, India. She has a keen interest in instrument control, LabVIEW programming for automation, computational and numerical techniques for electromagnetic problems.

Satya K. Dubey, Microwave Standards, CSIR National Physical Laboratory, New Delhi

Dr Satya Kesh Dubey has completed his PhD from electronics from Allahabad University, Allahabad, India. He has served various organisations in different capacities such as National Institute of Technology Raipur (C.G.) as Lecturer, Institute for Plasma Research as Post-Doctoral Fellow and National Aerospace Laboratories, Bangalore as Scientist Fellow. He joined National Physical Laboratory, New Delhi as Scientist in Microwave activity. He has published more than 25 paper in different international journals and conference proceedings. His current area of research is biological effect of EM radiations, Electromagnetic Induced transparency, E-field Probes and sensors, SAR probes, microstrip antenna, millimeter wave, and computational modelling of biological tissue in EM radiations.

V.N. Ojha, Microwave Standards, CSIR National Physical Laboratory, New Delhi

Mr V.N. Ojha has worked as Head, Time and Frequency and Electrical and Electronics Metrology Division. He has worked as a Scientist at CSIR- National Physical Laboratory, New Delhi for more than 30 year. He has keen research interest in low temperature microwave measurements, Josephson junction, Quantum Hall effect and Watt balance and is author of more than 100 Journal and Conference papers.