Nambissan P. Characterisation of Ion Implantation-induced Defects in Certain Technologically Important Materials by Positron Annihilation (Review Paper). DSJ [Internet]. 1Jul.2009 [cited 25Apr.2024];59(4):329-41. Available from: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/1531