Nambissan, P.M.G. “Characterisation of Ion Implantation-Induced Defects in Certain Technologically Important Materials by Positron Annihilation (Review Paper)”. Defence Science Journal 59, no. 4 (July 1, 2009): 329–341. Accessed July 1, 2025. https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/1531.