Gaur, Hari Mohan, Ashutosh Kumar Singh, and Umesh Ghaneka. “Design for Stuck-at Fault Testability in MCT Based Reversible Circuits”. Defence Science Journal 68, no. 4 (June 26, 2018): 381–387. Accessed June 15, 2025. https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/11328.