Choudhary, Khilawan, Latha Christie, S.K. Datta, and Manpuran Mahto. “K-Nearest Neighbors (KNN) Regression As a Tool for Failure Rate Prediction of Si MOSFET”. Defence Science Journal 75, no. 6 (November 6, 2025): 771–778. Accessed January 9, 2026. https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/21081.