GAUR, H. M.; SINGH, A. K.; GHANEKA, U. Design for Stuck-at Fault Testability in MCT based Reversible Circuits. Defence Science Journal, [S. l.], v. 68, n. 4, p. 381–387, 2018. DOI: 10.14429/dsj.68.11328. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/11328. Acesso em: 15 jun. 2025.