IYER, P. K.; SRIVASTAVA, T. N. A Sampling Inspection Scheme Based on Simple Markov Chains. Defence Science Journal, [S. l.], v. 15, n. 2, p. 55–60, 2014. DOI: 10.14429/dsj.15.7257. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/7257. Acesso em: 15 jun. 2025.