VIJAYAKUMAR, M.; RAMA RAO, V. V.; ANGELO, P. C. Scanning Electron Probe Microanalysis. Defence Science Journal, [S. l.], v. 39, n. 1, p. 13–32, 2013. DOI: 10.14429/dsj.39.4744. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/4744. Acesso em: 15 jun. 2025.