ATRE, M. V.; KUMAR, D. K. Fuzzy Logic and VLSI Testing. Defence Science Journal, [S. l.], v. 45, n. 4, p. 325–332, 2013. DOI: 10.14429/dsj.45.4140. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/4140. Acesso em: 6 jul. 2025.