ATRE, M. V.; LATHA, V. New Metric Based Algorithm for Test Vector Generation in VLSI Testing. Defence Science Journal, [S. l.], v. 45, n. 3, p. 255–265, 2013. DOI: 10.14429/dsj.45.4132. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/4132. Acesso em: 1 aug. 2025.