CHOUDHARY, K.; CHRISTIE, L.; DATTA, S.; MAHTO, M. K-Nearest Neighbors (KNN) Regression as a Tool for Failure Rate Prediction of Si MOSFET. Defence Science Journal, [S. l.], v. 75, n. 6, p. 771–778, 2025. DOI: 10.14429/dsj.21081. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/21081. Acesso em: 6 nov. 2025.