PATHAK, A.; TIWARI, M. K.; PANDEY, N.; PAUL, S. K.; RIZVI, S. M. I. Reliability Analysis of Radiation Tolerant Low Voltage CCCII Circuit For Space Applications. Defence Science Journal, [S. l.], v. 72, n. 6, p. 854–863, 2022. DOI: 10.14429/dsj.72.17583. Disponível em: https://publications.drdo.gov.in/ojs/index.php/dsj/article/view/17583. Acesso em: 15 jun. 2025.