Choudhary, K., Christie, L., Datta, S. and Mahto, M. 2025. K-Nearest Neighbors (KNN) Regression as a Tool for Failure Rate Prediction of Si MOSFET. Defence Science Journal. 75, 6 (Nov. 2025), 771–778. DOI:https://doi.org/10.14429/dsj.21081.