 | Wafer level testing |
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 | Qualification methodologies for ICs and MMICs for aerospace industry
Author : Sharma, Anesh K.;Prasad, Rajendra
Source : Defence Science Journal ; Vol:56(1) ; 2006 ; pp 87-91
Subject : 629.7 Aeronautics
Keywords : MMIC;Design verification;Qualification testing;Wafer level testing;Thermal characterisation;Process characterisation
Abstract : The ICs/MMICs attained importance in the field of microelectronics as these play a major role in the aerospace industry. The reliability of the ICs/MMICs becomes the critical issue because of complex material properties. A methodology has to be adopted which encompasses the qualification of ICs/MMICs for their use in the areas of strategic importance. A three-step procedure, which includes the process qualification, product qualification, and product acceptance is followed. The process qualification outlines a procedure that the foundry should follow to assure the quality, uniformity, and reproducibility from a specific process. Product qualification involves a set of simulations and measurements to establish the electrical, thermal, and reliability characteristics of a particular circuit design. Lastly, product acceptance is a series of tests performed on the deliverables. |
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